Probability Level Dependence of Failure Mechanisms in Sub-20 nm NAND Flash Memory

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저자

Duckseoung Kang, Kyunghwan Lee, Myounggon Kang, Seongjun Seo, Dong Hua Li, Yuchul Hwang and Hyungcheol Shin

저널 정보

IEEE Electron Device Letters (EDL)

출간연도

2014

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