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Study on self-heating effect and lifetime in vertical-channel field effect transistor
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Study on self-heating effect and lifetime in vertical-channel field effect transistor
Study on self-heating effect and lifetime in vertical-channel field effect transistor
저자
Ilho Myeong and Hyungcheol Shin
저널 정보
Microelectronics Reliability
출간연도
2021
링크
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Machine learning model for predicting threshold voltage by taper angle variation and word line position in 3D NAND flash memory
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Analysis and Compact Modeling of Fast Detrapping From Bandgap-Engineered Tunneling Oxide in 3-D NAND Flash Memories
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