Study on Time Constants of Random Telegraph Noise in Gate Leakage Current Through Hot-Carrier Stress Test

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저자

Heung-Jae Cho, Younghwan Son, Byoungchan Oh, Sanghoon Lee, Jong-Ho Lee, Byung-Gook Park, and Hyungcheol Shin

저널 정보

IEEE Electron Device Letters (EDL)

출간연도

2010

링크