An advanced scheme to match electric field between program verify and read operation in 3D NAND flash memory

Home · An advanced scheme to match electric field between program verify and read operation in 3D NAND flash memory

저자

Jaeyeop Jung, Sungju Kim, Sechun Park, Sung-Hyun Hwang, Donghun Kwak, Hyungcheol Shin

저널 정보

Japanese Journal of Applied Physics (JJAP)

출간연도

2025

링크