Analysis of Failure Mechanisms and Extraction of Activation Energies (Ea) in 21-nm nand Flash Cells

Home · Analysis of Failure Mechanisms and Extraction of Activation Energies (Ea) in 21-nm nand Flash Cells

저자

Kyunghwan Lee, Myounggon Kang, Seongjun Seo, Dong Hua Li, Jungki Kim and Hyungcheol Shin

저널 정보

IEEE Electron Device Letters (EDL)

출간연도

2013

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