Analysis of Failure Mechanisms During the Long-Term Retention Operation in 3-D NAND Flash Memories

Home · Analysis of Failure Mechanisms During the Long-Term Retention Operation in 3-D NAND Flash Memories

저자

Shinkeun Kim, Kyunghwan Lee, Changbeom Woo, Yuchul Hwang, and Hyungcheol Shin

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2020

링크