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Channel width dependence of hot electron injection program/hot hole erase cycling behavior in silicon-oxide-nitride-oxide-silicon (SONOS) memories

저자

Seung-Hwan Seo, Se-Woon Kim, Jang-Uk Lee, Gu-Cheol Kang, Kang-Seob Roh, Kwan-Young Kim, Soon-Young Lee, Chang-Min Choi, Kwan-Jae Song, So-Ra Park, Jun-Hyun Park, Ki-Chan Jeon, Dong Myong Kim, Dae Hwan Kim, Hyungcheol Shin, Jong Duk Lee and Byung-Gook Park

저널 정보

Solid-State Electronics

출간연도

2008

링크