Extraction of Effective Carrier Velocity and Observation of Velocity Overshoot in Sub-40 nm MOSFETs

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저자

Jun-Soo Kim, Jae-Hong Lee, Yeo-Nam Yun, Byung-Gook Park, Jong-Duk Lee, Hyung-Cheol Shin

저널 정보

Journal of Semiconductor Technology and Science

출간연도

2008

링크