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Distinguishing capture cross-section parameter between GIDL erase compact model and TCAD
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Distinguishing capture cross-section parameter between GIDL erase compact model and TCAD
Distinguishing capture cross-section parameter between GIDL erase compact model and TCAD
저자
Kul Lee and Hyungcheol Shin
저널 정보
Japanese Journal of Applied Physics
출간연도
2021
링크
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Analysis of the Effect of Residual Holes on Lateral Migration During the Retention Operation in 3-D NAND Flash Memory
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