Extraction of π-Type Substrate Resistance Based on Three-Port Measurement and the Model Verification up to 110 GHz

Home · Extraction of π-Type Substrate Resistance Based on Three-Port Measurement and the Model Verification up to 110 GHz

저자

In Man Kang, Jong Duk Lee, and Hyungcheol Shin

저널 정보

IEEE Electron Device Letters (EDL)

출간연도

2007

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