Extraction of Distance Between Interface Trap and Oxide Trap from Random Telegraph Noise in Gate-Induced Drain Leakage

Home · Extraction of Distance Between Interface Trap and Oxide Trap from Random Telegraph Noise in Gate-Induced Drain Leakage

저자

Youngsoo Seo, Sungwon Yoo, Joonha Shin, Hyunsoo Kim Hyunsuk Kim, Sangbin Jeon and Hyungcheol Shin

저널 정보

Journal of Nanoscience and Nanotechnology

출간연도

2016

링크