Home · Extraction of Interface-States Energy Distribution in Nitrided and Pure Gate Dielectrics for Metal Oxide Semiconductor Field Effect Transistor Applications
Home · Extraction of Interface-States Energy Distribution in Nitrided and Pure Gate Dielectrics for Metal Oxide Semiconductor Field Effect Transistor Applications
Extraction of Interface-States Energy Distribution in Nitrided and Pure Gate Dielectrics for Metal Oxide Semiconductor Field Effect Transistor Applications
저자
Younghwan Son, Seungwon Yang, Bong Chan Kim, Jinho Kim, Chang-Rok Moon, Duckhyung Lee, Jong-Duk Lee, Byung-Gook Park, and Hyungcheol Shin
