Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory

Home · Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory

저자

Doo-Hyun Kim, Il Han Park, Seongjae Cho, Jong Duk Lee, Hyungcheol Shin, and Byung-Gook Park

저널 정보

IEICE Transactions on Electronics

출간연도

2009

링크