Investigation of Random Telegraph Noise in Gate-Induced Drain Leakage and Gate Edge Direct Tunneling Currents of High-k MOSFETs

Home · Investigation of Random Telegraph Noise in Gate-Induced Drain Leakage and Gate Edge Direct Tunneling Currents of High-k MOSFETs

저자

Ju-Wan Lee, Byoung Hun Lee, Hyungcheol Shin, and Jong-Ho Lee

저널 정보

IEEE Transactions on Electron Devices(TED)

출간연도

2010

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