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Modeling of Polysilicon Depletion Effect in Recessed-Channel MOSFETs

저자

Yeonsung Kang, Heesang Kim, Jae Ho Lee, Younghwan Son, Byung-Gook Park, Jong Duk Lee,and Hyungcheol Shin

저널 정보

IEEE Electron Device Letters (EDL)

출간연도

2009

Abstract:

The polysilicon depletion effect is one of the key factors that degrade MOSFETs’ performance. In this letter, a polysilicon depletion model for recessed-channel (RC) MOSFETs is presented. The model shows good agreement with numerical device simulation results. We also compare the polysilicon depletion effect of RC MOSFETs to that of planar MOSFETs.