Separation of Corner Component in TAT Mechanism in Retention Characteristics of Sub 20-nm NAND Flash Memory

Home · Separation of Corner Component in TAT Mechanism in Retention Characteristics of Sub 20-nm NAND Flash Memory

저자

Kyunghwan Lee, Myounggon Kang, Seongjun Seo, Duckseoung Kang, Dong Hua Li, Yuchul Hwang and Hyungcheol Shin

저널 정보

IEEE Electron Device Letters (EDL)

출간연도

2014

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