Study on the Oxide Trap Distribution in a Thin Gate Oxide from Random Telegraph Noise in the Drain Current and the Gate Leakage Current

Home · Study on the Oxide Trap Distribution in a Thin Gate Oxide from Random Telegraph Noise in the Drain Current and the Gate Leakage Current

저자

Heung-Jae Cho, Younghwan Son, Sanghoon Lee, Jong-Ho Lee, Byung-Gook Park, and Hyungcheol Shin

저널 정보

Journal of the Korean Physical Society

출간연도

2011

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